Hm, The output section is right out of OnSemi's application notes.
Devices like this give me the willies, since so much relies on them. If it were me, I would be tempted to test the transistor portions to see if they are still good, and if so, perhaps see if a diode applied the transistor could sub for the diode portion of the device. If the amp heats up or has crossover/notch distortion issues, then a bias scheme would have to be employed.
But of course outfitting it with new devices seems the preferred method. This just doesn't seem like it would be that hard to sort out.
Devices like this give me the willies, since so much relies on them. If it were me, I would be tempted to test the transistor portions to see if they are still good, and if so, perhaps see if a diode applied the transistor could sub for the diode portion of the device. If the amp heats up or has crossover/notch distortion issues, then a bias scheme would have to be employed.
But of course outfitting it with new devices seems the preferred method. This just doesn't seem like it would be that hard to sort out.